DIN ISO 24173:2025-11
Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24173:2024)
| Edition date: |
2025-11-01
In Force
|
|---|---|
| Available languages: | English, Alemán |
| Summary: | This document gives guidance on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition. |
| Keywords: | Analysis|Back-scattering|Chemical analysis and testing|Chemical composition|Crystallography|Crystals|Definitions|Determination|Diffraction|Electron beams|Electron diffraction|Interpretations|Measurement|Measuring accuracy|Measuring instruments|Measuring techniques|Methods|Methods of analysis|Microanalysis|Microbeam analysis|Orientation|Sampling methods|Scanning electron microscopes|Test reports|Test specimens|Testing|X-ray diffraction|X-ray fluorescence|X-ray spectrometer |
| ICS: | 71.040.50-Physicochemical methods of analysis |
| CTN: | |
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International Equivalence |
Identic ISO 24173:2024 |
|
Reemplazo Normas |
Reemplaza a DIN ISO 24173:2013-04 Reemplaza a DIN ISO 24173:2025-04 |
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