IEC 63003:2015
Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™
| Edition date: |
2015-12-14
In Force
|
|---|---|
| Available languages: | English |
| ICS: | 25.040.01-Industrial automation systems in general |
| CTN: | 1286 |
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