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AFNOR
NF EN 60749-40
En Vigor
2012-02-01
Semiconductor devices - Mechanical and climatic test methods - Part 40 :
board level drop test method using a strain gauge
AFNOR
FD CEN/TR 14748
En Vigor
2005-01-01
Non-destructive testing - Methodology for qualification of
non-destructive tests
AFNOR
AFNOR










