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AFNOR

NF EN 60749-44
En Vigor
2016-12-23
Semiconductor devices - Mechanical and climatic test methods - Part 44 : neutron beam irradiated single event effect (SEE) test method for semiconductor devices
AFNOR

NF EN 50696
En Vigor
2021-02-12
Contact Interface for Automated Connection Device
AFNOR

NF EN ISO 5456-4
En Vigor
2001-12-01
Technical drawings - Projection methods - Part 4 : central projection
AFNOR

NF EN 60027-1/A2
En Vigor
2007-09-01
Letter symbols to be used in electrical technology - Part 1 : general