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AFNOR
NF EN 60444-9
En Vigor
2014-05-02
Measurement of quartz crystal unit parameters - Part 9 : measurement of
spurious resonances of piezoelectric crystal units
AFNOR
NF EN ISO 14232-1
En Vigor
2017-06-10
Thermal spraying - Powders - Part 1 : characterization and technical
supply conditions
AFNOR
NF EN 62007-1/A1
En Vigor
2022-10-28
Semiconductor optoelectronic devices for fibre optic system applications
- Part 1: Specification template for essential ratings and characteristics
AFNOR
AFNOR
NF EN 62453-303-2
En Vigor
2016-09-03
Field device tool (FDT) interface specification - Part 303-2:
Communication profile integration - IEC 61784 CP 3/4, CP 3/5 and CP 3/6
AFNOR
AFNOR
NF B49-415
En Vigor
1968-01-01
Chemical analysis of refractories. Silica materials, silico-argillaceous
and argillaceous materials. Determination of manganese.
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