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IEC

IEC TS 62749:2020 RLV

En Vigor
2020-02-11
Assessment of power quality - Characteristics of electricity supplied by public networks
IEC

IEC 62220-1-1:2015

En Vigor
2015-03-12
Medical electrical equipment - Characteristics of digital X-ray imaging devices - Part 1-1: Determination of the detective quantum efficiency - Detectors used in radiographic imaging
IEC

IEC 62047-11:2013

En Vigor
2013-07-17
Semiconductor devices - Micro-electromechanical devices - Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems
ISO

ISO/IEC 9646-1:1994

En Vigor
1994-12-22
Information technology — Open Systems Interconnection — Conformance testing methodology and framework — Part 1: General concepts
IEC

IEC 61603-3:1997

En Vigor
1997-10-30
Transmission of audio and/or video and related signals using infra-red radiation - Part 3: Transmission systems for audio signals for conference and similar systems
IEC

IEC 60098:2020

En Vigor
2020-01-10
Analogue audio disk records and reproducing equipment
IEC

IEC 60335-2-9:2019 RLV

En Vigor
2019-05-17
Household and similar electrical appliances - Safety - Part 2-9: Particular requirements for grills, toasters and similar portable cooking appliances
IEC

IEC TS 62600-103:2024

En Vigor
2024-07-03
Marine energy - Wave, tidal and other water current converters - Part 103: Guidelines for the early stage development of wave energy converters - Best practices and recommended procedures for the testing of pre-prototype devices
IEC

IEC 61967-1:2018 RLV

En Vigor
2018-12-12
Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
ISO

ISO/IEC 39794-1:2019

En Vigor
2019-12-20
Information technology — Extensible biometric data interchange formats — Part 1: Framework
IEC

IEC 60315-6:1991/COR1:1997

En Vigor
1997-02-28
Corrigendum 1 - Methods of measurement on radio receivers for various classes of emission - Part 6: General purpose communication receivers
IEC

IEC 60749-10:2022

En Vigor
2022-04-27
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly