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IEC
IEC 61784-5-20:2018
En Vigor
2018-08-30
Industrial communication networks - Profiles - Part 5-20: Installation
of fieldbuses - Installation profiles for CPF 20
IEC
IEC 62047-17:2015
En Vigor
2015-03-05
Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge
test method for measuring mechanical properties of thin films
IEC
IEC TR 62697-2:2018
En Vigor
2018-02-14
Test methods for quantitative determination of corrosive sulfur
compounds in unused and used insulating liquids - Part 2: Test method
for quantitative determination of total corrosive sulfur (TCS)
IEC
IEC 60748-20:1988/AMD1:1995
En Vigor
1995-09-22
Amendment 1 - Semiconductor devices. Integrated circuits. Part 20:
Generic specification for film integrated circuits and hybrid film
integrated circuits
