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IEC
IEC 62137-3:2011
En Vigor
2011-11-08
Electronics assembly technology - Part 3: Selection guidance of
environmental and endurance test methods for solder joints
IEC
IEC 60738-1-1:2008
En Vigor
2008-02-13
Thermistors - Directly heated positive step-function temperature
coefficient - Part 1-1: Blank detail specification - Current limiting
application - Assessment level EZ
IEC
IEC 62047-16:2015
En Vigor
2015-03-05
Semiconductor devices - Micro-electromechanical devices - Part 16: Test
methods for determining residual stresses of MEMS films - Wafer
curvature and cantilever beam deflection methods
IEC
IEC 62821-1:2015
En Vigor
2015-02-13
Electric cables - Halogen-free, low smoke, thermoplastic insulated and
sheathed cables of rated voltages up to and including 450/750 V - Part
1: General requirements
