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IEC
IEC 63275-1:2022
En Vigor
2022-04-21
Semiconductor devices - Reliability test method for silicon carbide
discrete metal-oxide semiconductor field effect transistors - Part 1:
Test method for bias temperature instability
ISO
ISO/IEC TS 27034-5-1:2018
En Vigor
2018-05-07
Information technology — Application security — Part 5-1: Protocols and
application security controls data structure, XML schemas
IEC
ISO 80079-36:2016/COR1:2019
En Vigor
2019-10-22
Corrigendum 1 - Explosive atmospheres - Part 36: Non-electrical
equipment for explosive atmospheres - Basic method and requirements
IEC
ISO/IEC 19086-2:2018/AMD1:2023
En Vigor
2023-01-27
Cloud computing - Service level agreement (SLA) framework - Part 2:
Metric model - Amendment 1
