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IEC
IEC 62878-2-5:2019
En Vigor
2019-09-16
Device embedding assembly technology - Part 2-5: Guidelines -
Implementation of a 3D data format for device embedded substrate
IEC
IEC 63068-1:2019
En Vigor
2019-01-30
Semiconductor devices - Non-destructive recognition criteria of defects
in silicon carbide homoepitaxial wafer for power devices - Part 1:
Classification of defects
IEC
IEC 62321-3-2:2020
En Vigor
2020-06-30
Determination of certain substances in electrotechnical products - Part
3-2: Screening - Fluorine, bromine and chlorine in polymer and
electronics by combustion-ion chromatography (C-IC)
IEC
IEC TR 61000-1-1:2023
En Vigor
2023-02-07
Electromagnetic compatibility (EMC) - Part 1-1: General - Application
and interpretation of fundamental definitions and terms
IEC
IEC 62878-1-1:2015
En Vigor
2015-05-20
Device embedded substrate - Part 1-1: Generic specification - Test methods
IEC
IEC 62715-6-22:2023
En Vigor
2023-03-10
Flexible display devices - Part 6-22: Crease and waviness measurement methods
IEC
ISO
ISO/IEC 23360-1-5:2021
En Vigor
2021-10-08
Linux Standard Base (LSB) — Part 1-5: Imaging specification
