NF EN 61967-2
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2 : measurement of radiated emissions, TEM-cell and wideband TEM-cell method
| Fecha edición: |
2006-02-01
En Vigor
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| Idiomas disponibles: | Inglés, Francés |
| Keywords: | INTEGRATED CIRCUITS|ELECTROMAGNETIC COMPATIBILITY|ELECTROMAGNETIC INTERFERENCE|EMISSION|MEASUREMENT|TESTS|TESTING CONDITIONS|TEST EQUIPMENT |
| ICS: | 31.200 - Circuitos integrados. Microelectrónica, 33.100.10 - Emisión |
| CTN: | |
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Equivalencia Internacional |
Idéntica EN 61967-2:2005 Idéntica IEC 61967-2:2005 |










