UTE C86-614/A6
| Fecha edición: |
1980-01-01
En Vigor
|
|---|---|
| Idiomas disponibles: | Francés |
| Keywords: | VIBRATION TESTS|TENSION TESTS|SPECIFICATIONS|QUALITY CONTROL|MECHANICAL TESTS|ELECTRICAL TESTS|THERMAL SHOCK TESTS|TESTING CONDITIONS|ELECTRONIC COMPONENTS|BIPOLAR TRANSISTORS|WELDABILITY TESTS|TESTS|TECHNICAL DATA SHEETS|HIGH TEMPERATURE TESTS|SEMICONDUCTOR DEVICES|IMPACT TESTS|THERMAL TESTS|DAMP HEAT TESTS|ELECTRIC ENDURANCE TESTS |
| ICS: | 31.080 - Dispositivos semiconductores, 31.080.30 - Transistores, 31 - ELECTRONICA |
| CTN: |
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