UTE C86-614/A7
| Fecha edición: |
1981-01-01
En Vigor
|
|---|---|
| Idiomas disponibles: | Francés |
| Keywords: | QUALITY CONTROL|MECHANICAL TESTS|TESTS|VIBRATION TESTS|THERMAL TESTS|ELECTRIC ENDURANCE TESTS|SEMICONDUCTOR DEVICES|DAMP HEAT TESTS|TENSION TESTS|HIGH TEMPERATURE TESTS|ELECTRONIC COMPONENTS|TECHNICAL DATA SHEETS|IMPACT TESTS|SPECIFICATIONS|BIPOLAR TRANSISTORS|ELECTRICAL TESTS|WELDABILITY TESTS|THERMAL SHOCK TESTS|TESTING CONDITIONS |
| ICS: | 31.080 - Dispositivos semiconductores, 31.080.30 - Transistores, 31 - ELECTRONICA |
| CTN: |
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