-50% de descuento* Si compras la misma norma UNE en distintos idiomas. * Dto. sobre el pvp inferior. Ver condiciones

DIN 50452-2:2009-10

Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 2: Determination of particles by optical particle counters

Fecha edición: 2009-10-01
En Vigor
Idiomas disponibles: Alemán
Resumen: This document specifies a method for the determination of the concentration of particles by using of automatic flow measuring equipments for particles. The method is based on the laser scattered light method and allows the particle size to be measured and the measured particle to be counted in specified size ranges. This document is applicable to liquid reagents commonly used in semiconductor technology with particle sizes of 0,1 µm and greater.

Keywords: Analysis|Concentration|Concentration of particles|Definitions|Determination of content|Liquids|Materials|Materials testing|Particle analysis|Particulate matter measurement|Semiconductor materials|Semiconductor technology|Semiconductors|Testing
ICS: 29.045 - Materiales semiconductores
CTN:

Reemplazo Normas

Reemplaza a DIN 50452-2:1991-03

Reemplaza a DIN 50452-2:2008-04

El libro en palabras del autor

Ultricies magna feugiat malesuada sociosqu varius vivamus cubilia parturient, himenaeos vitae vehicula nam placerat netus urna platea, nostra rutrum felis mattis penatibus velit quisque.

Button
Preguntas frecuentes ¿Tienes alguna duda sobre nuestros productos?

Respuesta 2

Desde la web

Libros y normas