DIN 50989-6:2024-02
Ellipsometry - Part 6: Effective Materials model; Text in German and English
| Fecha edición: |
2024-02-01
En Vigor
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| Idiomas disponibles: | Alemán, Inglés |
| Resumen: | This document uses ellipsometric measurements and their analysis to specify the method for the determination of the layer thickness of effective material layers as well as their optical constants /dielectric functions based on the effective materials model. |
| Keywords: | Coating thickness|Definitions|Effective|Ellipsometry|Layer thickness measurement|Layers|Materials|Materials testing|Measuring techniques|Models|Non-invasive|Testing |
| ICS: | 19.100 - Ensayos no destructivos |
| CTN: | |
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Reemplazo Normas |
Reemplaza a DIN 50989-6:2023-03 |
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