DIN 51418-1:2025-05
X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 1: General vocabulary; Text in German and English
| Fecha edición: |
2025-05-01
En Vigor
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| Idiomas disponibles: | Alemán, Inglés |
| Resumen: | This document specifies general vocabulary for the X?ray fluorescence analysis of solid and liquid materials. This document does not contain terms relating to the planning of analyses, sample preparation, calibration/evaluation, or consideration of measurement uncertainties. These are dealt with separately in DIN 51418-2. X?ray fluorescence analysis is an analytical method for the identification and quantification of chemical elements contained in a substance, and for the determination of layer thicknesses. For this purpose, the substance is excited to emit element specific radiation whose spectral composition contains this information. The purpose of this document is to harmonize the use of technical terms for the X?ray fluorescence analysis and to achieve their best possible agreement with different fields of optical atomic spectral analysis, i.e., optical emission spectrometry (OES), atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS). The structure of this document follows the principle of an "optical bench": supply of X?rays, primary X?ray optics, physical interaction of X?rays, sample radiation, secondary X?ray optics, measurement of sample radiation and results of measurement. |
| Keywords: | Analysis|Basis|Definitions|Materials testing|Measurement|Measuring techniques|Radiation measurement|Radiation sources|Samples|Terminology|Terminology standard|Terms|Vocabulary|X-ray analysis|X-ray fluorescence spectrometry|X-ray spectrometry|X-rays |
| ICS: | 71.040.50 - Métodos de análisis físicoquímicos, 01.040.71 - Ingeniería química (Vocabularios) |
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Reemplazo Normas |
Reemplaza a DIN 51418-1:2008-08 Reemplaza a DIN 51418-1:2024-08 |
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