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DIN EN 15991:2016-02

Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV); German version EN 15991:2015

Fecha de anulación: 2025-11-01
Anulada
Idiomas disponibles: Inglés, Alemán
Resumen: This European Standard defines a method for the determination of the trace element concentrations of Al, Ca, Cr, Cu, Fe, Mg, Ni, Ti, V and Zr in powdered and granular silicon carbide. Dependent on element, wavelength, plasma conditions and weight, this test method is applicable to mass contents of the above trace contaminations from about 0,1 mg/kg to about 1000 mg/kg, after evaluation also from 0,001 mg/kg to about 5000 mg/kg.

Keywords: Ceramic|Ceramics|Chemical analysis and testing|Electrothermal|Emission spectrophotometry|Evaporation|Granular|ICP|Impurities|Inductively Coupled Plasma|Inter-laboratory tests|Mass concentration|Materials|Materials testing|Measuring instruments|OES|Optical Emission Spectroscopy|Powdery|Raw materials|Reagents|Sampling methods|Silicon carbide|Spectrometers|Test reports|Testing|Trace element analysis|Trace elements
ICS: 81.060.10 - Materias primas
CTN:

Equivalencia Internacional

Idéntica EN 15991:2015

Reemplazo Normas

Reemplaza a DIN EN 15991:2011-04

Reemplaza a DIN EN 15991:2014-07

Es reemplazada por DIN EN 15991:2025-11

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