DIN EN 60444-1:2000-09
Measurement of quartz crystal unit parameters by zero phase technique in a -network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a -network (IEC 60444-1:1986 + A1:1999); German version EN 60444-1:1997 + A1:1999 / Note: DIN EN 60444-1 (1997-10) remains valid alongside this standard until 2002-10-01.
| Fecha edición: |
2000-09-01
En Vigor
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| Idiomas disponibles: | Alemán |
| Resumen: | In the document some formulae of the appendix to IEC 60444-1 are updated, taking into account the modied calibration procedure of the In dem Dokument werden einige Formeln des Anhanges zur IEC 60444-1 unter Berücksichtigung des geänderten Kalibrierverfahrens des |
| Keywords: | Crystals (electronic)|Electrical engineering|Electronic engineering|Frequencies|Measuring instruments|Measuring network|Measuring techniques|Piezoelectric devices|Piezoelectricity|Quartz|Resonance resistance|Resonant frequency|Zero phase|Zero-method |
| ICS: | 31.140 - Dispositivos piezoeléctricos y dieléctricos |
| CTN: | |
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Equivalencia Internacional |
Idéntica EN 60444-1:1997/A1:1999 Idéntica IEC 60444-1:1986/AMD1:1999 |
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Reemplazo Normas |
Reemplaza a DIN EN 60444-1:1997-10 Reemplaza a DIN IEC 49/316/CD:1996-03 |
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