DIN EN 60444-2:1997-10
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units (IEC 60444-2:1980); German version EN 60444-2:1997
| Fecha edición: |
1997-10-01
En Vigor
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|---|---|
| Idiomas disponibles: | Alemán |
| Resumen: | The document describes a method of measuring the motional capacitance of quartz crystal units in the frequency range of 1 MHz to 125 MHz. Das Dokument beschreibt ein Meßverfahren zur Ermittlung der dynamischen Kapazitiät von Schwingquarzen im Frequenzbereich von 1 MHz bis 125 MHz. |
| Keywords: | Capacitance measurement|Circuit networks|Connections for measurement|Crystals (electronic)|Dynamic|Electrical engineering|Measurement|Measuring accuracy|Measuring techniques|Motional|Parameters|Phase measurement (electric)|Phase offset method|Piezoelectric|Piezoelectric devices|Piezoelectricity|Principle of measurement|Zero phase|Zero-method |
| ICS: | 31.140 - Dispositivos piezoeléctricos y dieléctricos |
| CTN: | |
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Equivalencia Internacional |
Idéntica EN 60444-2:1997 Idéntica IEC 60444-2:1980 |
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Reemplazo Normas |
Reemplaza a DIN IEC 60444-2:1992-11 |
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