DIN EN 60444-4:1997-10
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 4: Method for the measurement of the load resonance frequency f<(Index)L>, load resonance resistance R<(Index)L> and the calculation of other derived values of quartz crystal units, up to 30 MHz (IEC 60444-4:1988); German version EN 60444-4:1997
| Fecha edición: |
1997-10-01
En Vigor
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| Idiomas disponibles: | Alemán |
| Resumen: | The document specifies a method of measuring load resonance frequency f<(Index)L> and load resonance resistance R<(Index)L> in the frequency range up to 30 MHz. Das Dokument beschreibt ein Verfahren zur Messung der Lastresonanzfrequenz f<(Index)L> und des Lastresonanzwiderstandes R<(Index)L> im Frequenzbereich bis 30 MHz. |
| Keywords: | Capacitance measurement|Circuit networks|Connections for measurement|Crystals (electronic)|Electrical engineering|Error analysis|Errors in measuring|Frequencies|Loading|Measurement|Measuring techniques|Parameters|Phase measurement (electric)|Resonance resistance|Resonant frequency|Zero phase|Zero-method |
| ICS: | 31.140 - Dispositivos piezoeléctricos y dieléctricos |
| CTN: | |
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Equivalencia Internacional |
Idéntica EN 60444-4:1997 |
|
Reemplazo Normas |
Reemplaza a DIN IEC 60444-4:1992-11 |
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