DIN EN 60512-6-2:2003-01
Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests; Test 6b: Bump (IEC 60512-6-2:2002); German version EN 60512-6-2:2002 / Note: DIN IEC 60512-4 (1994-05) remains valid alongside this standard until 2005-04-01.
| Fecha edición: |
2003-01-01
En Vigor
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|---|---|
| Idiomas disponibles: | Alemán |
| Resumen: | The object of this test is to define a standard test method to assess the ability of components to withstand specified severities of bump. Dieses Prüfverfahren dient dazu, die Widerstandsfähigkeit von Bauelementen gegenüber festgelegten Beanspruchungen mit Dauerschocken zu beurteilen. |
| Keywords: | Bump tests|Components|Connectors|Dynamic stress|Dynamic testing|Electric plugs|Electrical engineering|Electromechanical|Electromechanics|Electronic engineering|Electronic equipment|Electronic equipment and components|Electronic instruments|Measuring techniques|Permanent shocking|Stress tests|Testing|Vibration |
| ICS: | 31.220.10 - Dispositivos de bases y clavijas. Conectores |
| CTN: | |
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Equivalencia Internacional |
Idéntica EN 60512-6-2:2002 Idéntica IEC 60512-6-2:2002 |
|
Reemplazo Normas |
Reemplaza a DIN IEC 48B/836/CD:2000-04 Reemplaza a DIN IEC 60512-4:1994-05 |
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