DIN EN 60747-15:2012-08
Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices (IEC 60747-15:2010); German version EN 60747-15:2012 / Note: DIN EN 60747-15 (2004-08) remains valid alongside this standard until 2014-01-20.*A transition period, as set out in DIN EN IEC 60747-15 (2025-08), exists until 2027-11-30.
| Fecha de anulación: |
2025-08-01
Anulada
|
|---|---|
| Idiomas disponibles: | Alemán |
| Resumen: | This part of IEC 60747 gives the requirements for isolated power semiconductor devices excluding devices with incorporated control circuits. Dieser Teil von IEC 60747 enthält die Anforderungen für isolierte Leistungs-Halbleiterbauelemente, ausgenommen Bauelemente mit eingebauter Steuerschaltung. |
| Keywords: | Acceptance inspection|Components|Definitions|Discrete devices|Electrical engineering|Electrical insulating materials|Electronic engineering|Electronic equipment and components|Endurance testing|Inspection|Integrated circuits|Measurement|Measuring techniques|Reliability|Semiconductor devices|Symbols|Testing |
| ICS: | 31.080.01 - Dispositivos semiconductores en general |
| CTN: | |
|
Equivalencia Internacional |
Idéntica EN 60747-15:2012 Idéntica IEC 60747-15:2010 |
|
Reemplazo Normas |
Reemplaza a DIN EN 60747-15:2004-08 Reemplaza a DIN IEC 60747-15:2007-06 Es reemplazada por DIN EN IEC 60747-15:2025-08 |
Normas citadas
Libros relacionados
Normas relacionadas
Colecciones temáticas relacionadas
