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DIN EN 60749-24:2004-09
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST (IEC 60749-24:2004); German version EN 60749-24:2004 / Note: To be replaced by DIN EN IEC 60749-24 (2025-04).
| Fecha edición: |
2004-09-01
En Vigor
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|---|---|
| Idiomas disponibles: | Alemán |
| Resumen: | The unbiased highly accelerated stress testing (HAST) specified in this part of DIN EN 60749 is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. Das in diesem Teil von DIN EN 60749 beschriebene hochbeschleunigende Prüfverfahren ohne elektrische Beanspruchung wird verwendet, um die Zuverlässigkeit von nicht hermetisch verkappten (kunststoffverkappten) Halbleiterbauelementen unter feuchten Umgebungsbedingungen zu beurteilen. |
| Keywords: | Bond strength|Climatic tests|Components|Destructive testing|Electrical engineering|Electronic engineering|Electronic equipment and components|Environmental testing|Environmental tests|Failure analysis|Failure frequency|Failure rates|Integrated circuits|Mechanical testing|Moisture resistance|Semiconductor devices|Statistics of failure|Testing |
| ICS: | 31.080.01 - Dispositivos semiconductores en general |
| CTN: | |
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Equivalencia Internacional |
Idéntica EN 60749-24:2004 Idéntica IEC 60749-24:2004 |
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Reemplazo Normas |
Reemplaza a DIN IEC 60749-24:2002-11 |
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