DIN EN 60749-6:2017-11
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 60749-6:2017); German version EN 60749-6:2017 / Note: DIN EN 60749-6 (2003-04) remains valid alongside this standard until 2020-04-07.
| Fecha edición: |
2017-11-01
En Vigor
|
|---|---|
| Idiomas disponibles: | Alemán |
| Resumen: | The purpose of this part of DIN EN 60749 is to test and determine the effect on all solid state electronic devices of storage at elevated temperature without electrical stress applied. Zweck dieses Teils der DIN EN 60749 ist es, die Wirkung erhöhter Temperatur auf alle elektronischen Halbleiterbauelemente bei ihrer Lagerung ohne elektrische Beanspruchung zu prüfen und zu bestimmen. |
| Keywords: | Climate|Climatic tests|Components|Electrical engineering|Electrical measurement|Electronic engineering|Electronic equipment and components|Environmental testing|High temperatures|Integrated circuits|Mechanical testing|Semiconductor devices|Semiconductors|Storage|Temperature|Temperature test|Testing |
| ICS: | 31.080.01 - Dispositivos semiconductores en general |
| CTN: | |
|
Equivalencia Internacional |
Idéntica EN 60749-6:2017 Idéntica IEC 60749-6:2017 |
|
Reemplazo Normas |
Reemplaza a DIN EN 60749-6:2003-04 Reemplaza a DIN EN 60749-6:2016-09 |
Normas citadas
Libros relacionados
Normas relacionadas
Colecciones temáticas relacionadas
