DIN EN 62276:2017-08
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2016); German version EN 62276:2016 / Note: DIN EN 62276 (2013-08) remains valid alongside this standard until 2019-11-28.*A transition period, as set out in DIN EN IEC 62276 (2026-03), exists until 2028-04-30.
| Fecha de anulación: |
2026-03-01
Anulada
|
|---|---|
| Idiomas disponibles: | Alemán |
| Resumen: | This document applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators. Dieses Dokument gilt für die Herstellung von Einkristall-Wafern aus synthetischen Quarzkristallen, Lithiumniobat-(LN-), Lithiumtantalat-(LT-), Lithiumtetraborat-(LBO-)Kristallen und Lanthanum-Gallium-Silikat (LGS), die für die Verwendung als Substrate bei der Herstellung von Oberflächenwellen-(OFW-)Filtern und Resonatoren vorgesehen sind. |
| Keywords: | Acoustic waves|Components|Crystal lattices|Crystals (electronic)|Definitions|Electrical engineering|Electrical properties|Electrical properties and phenomena|Electronic equipment and components|Frequency stabilization|Lithium|Measurement|Measuring techniques|Methods for measuring|Piezoelectric devices|Piezoelectricity|Quartz crystals|Ratings|Single crystal|Specifications|Surface acoustic wave devices|Surface acoustic waves|Testing|Wafers |
| ICS: | 31.140 - Dispositivos piezoeléctricos y dieléctricos |
| CTN: | |
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Equivalencia Internacional |
Idéntica EN 62276:2016 Idéntica IEC 62276:2016 |
|
Reemplazo Normas |
Reemplaza a DIN EN 62276:2013-08 Reemplaza a DIN EN 62276:2015-04 Es reemplazada por DIN EN IEC 62276:2026-03 |
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