DIN EN IEC 60749-18:2020-02
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 60749-18:2019); German version EN IEC 60749-18:2019 / Note: DIN EN 60749-18 (2003-09) remains valid alongside this standard until 2022-05-15.
| Fecha edición: |
2020-02-01
En Vigor
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| Idiomas disponibles: | Alemán |
| Resumen: | This part of DIN EN 60749 provides requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 gamma ray source. Dieser Teil der DIN EN 60749 legt Anforderungen und Bedingungen für das Prüfen von verkappten integrierten Halbleiterschaltungen (IC) und Einzel-Halbleiterbauelementen auf Auswirkungen ionisierender Strahlungen (gesamte (integrale) Energiedosis) aus einer Kobalt-60-Gammastrahlenquelle fest. |
| Keywords: | Annealing|Climate|Climatic tests|Components|Definitions|Destructive testing|Effect|Electrical engineering|Electrical measurement|Electronic engineering|Electronic equipment and components|Environmental testing|Integrated circuits|Ionizing radiation|Mechanical testing|Military equipment|Phototherapy|Radiation effects|Semiconductor devices|Semiconductors|Space transport|Specification (approval)|Tempering|Testing |
| ICS: | 31.080.01 - Dispositivos semiconductores en general |
| CTN: | |
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Equivalencia Internacional |
Idéntica EN IEC 60749-18:2019 Idéntica IEC 60749-18:2019 RLV |
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Reemplazo Normas |
Reemplaza a DIN EN 60749-18:2003-09 Reemplaza a DIN EN 60749-18:2018-10 |
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