DIN EN IEC 63287-1:2023-09
Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification (IEC 63287-1:2021); German version EN IEC 63287-1:2021 / Note: DIN EN 60749-43 (2018-05) remains valid alongside this standard until 2024-09-29.
| Fecha edición: |
2023-09-01
En Vigor
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| Idiomas disponibles: | Alemán |
| Resumen: | This part of DIN EN IEC 63287 gives guidelines for reliability qualification plans of large scale semiconductor integrated circuit products (LSI). This document is not intended for military- and space-related applications. Dieser Teil der DIN EN IEC 62387 enthält Leitlinien für Qualifikationspläne zur Zuverlässigkeit von großen Halbleiter-IC-Produkten. Das Dokument ist nicht für Anwendungen in der Luft- und Raumfahrt vorgesehen. |
| Keywords: | Backward compatibility|Climate|Climatic tests|Components|Cyclic loading|Defects|Definitions|Electrical engineering|Electrical measurement|Electronic engineering|Electronic equipment and components|Environment|Environmental testing|Environmental tests|Failure rates|Impurities|Integrated circuits|Mechanical testing|Qualifications|Quality|Reliability|Resistance|Semiconductor devices|Semiconductors|SMD|Surface mounting|Testing |
| ICS: | 31.080.01 - Dispositivos semiconductores en general |
| CTN: | |
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Equivalencia Internacional |
Idéntica EN IEC 63287-1:2021 Idéntica IEC 63287-1:2021 |
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Reemplazo Normas |
Reemplaza a DIN EN 60749-43:2018-05 Reemplaza a DIN EN IEC 63287-1:2020-06 |
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