DIN EN ISO 16371-2:2019-04
Non-destructive testing - Industrial computed radiography with storage phosphor imaging plates - Part 2: General principles for testing of metallic materials using X-rays and gamma rays (ISO 16371-2:2017, Corrected version 2018-05); German version EN ISO 16371-2:2017
| Fecha edición: |
2019-04-01
En Vigor
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| Idiomas disponibles: | Inglés, Alemán |
| Resumen: | This document specifies fundamental techniques of computed radiography with the aim of enabling satisfactoryand repeatable results to be obtained economically. The techniques are based on the fundamental theory of the subject andtests measurements. This document specifies the general rules for industrial computed X- and gamma radiography for flawdetection purposes, using storage phosphor imaging plates (IP). It is based on the general principles for radiographicexamination of metallic materials on the basis of films (ISO 5579). The basic set-up of radiation source, detector and thecorresponding geometry shall be applied in agreement with ISO 5579 and the corresponding product standards as e. g. ISO17636 for welding and EN 12681 for foundry. It does not lay down acceptance criteria of the imperfections. |
| Keywords: | Checking equipment|Classification|Computer technology|CR|Definitions|Design|Diffraction|Display devices (computers)|Electrical engineering|Figures|Foil|Gamma-radiation|Gamma-ray|Image quality|Imaging plates|Industrial|Instruments|Ionizing radiation|Irradiation|Macroscopic|Marking|Material defect|Material tests|Materials|Materials testing|Measurement|Measuring devices|Measuring techniques|Metallic materials|Method testing|Non-destructive|Non-destructive testing|Optical measurement|Phosphorus|Product specification|Radiation protection|Radiographic testing|Radiographs|Radiography|Radiology|Radiology apparatus (medical)|Recording|Residual stresses|Samples|Sensitivity|Signal-to-interference ratio|Specification (approval)|Specifications|Storage|Stress|Surfaces|Test equipment|Test pieces|Testing|Testing devices|X-ray|X-ray diffraction|X-ray diffraction analysis|X-ray technique|X-rays |
| ICS: | 19.100 - Ensayos no destructivos |
| CTN: | |
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Equivalencia Internacional |
Idéntica EN ISO 16371-2:2017 Idéntica ISO 16371-2:2017 |
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Reemplazo Normas |
Reemplaza a DIN EN ISO 16371-2:2018-02 |
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