DIN IEC 60747-11:1992-04
Semiconductor devices; sectional specification for semiconductor devices; identical with IEC 60747-11:1985
| Fecha edición: |
1992-04-01
En Vigor
|
|---|---|
| Idiomas disponibles: | Alemán |
| Resumen: | The standard contains the sectional specification for discrete semiconductor devices within the IEC-quality assessment system for electronic devices. Die Norm enthält die Rahmenspezifikation für Einzel-Halbleiterbauelemente im Rahmen des IEC-Gütebestätigungssystems für Bauelemente der Elektronik. |
| Keywords: | Components|Electrical engineering|Electronic engineering|Electronic equipment and components|Inspection|Integrated circuits|Marking|Measurement|Methods for measuring|Quality|Quality assessment|Quality assessment systems|Sectional specification|Semiconductor devices|Semiconductors|Specification (approval)|Specifications|Testing |
| ICS: | 31.080.01 - Dispositivos semiconductores en general |
| CTN: | |
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Equivalencia Internacional |
Idéntica IEC 60747-11:1985/AMD2:1996 |
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