DIN IEC 60747-2:2001-02
Semiconductor devices - Discrete devices and integrated circuits - Part 2: Rectifier diodes (IEC 60747-2:2000)
| Fecha edición: |
2001-02-01
En Vigor
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| Idiomas disponibles: | Alemán |
| Resumen: | The document includes Amendments 1 and 2, concerns forward recovery and reverse recovery. Das Dokument enthält Änderung 1 und 2 und betrifft die Durchlaß- und Sperrverzögerung. |
| Keywords: | Acceptance inspection|Components|Continuity tests|Definitions|Diodes|Discrete devices|Electrical engineering|Electrical measurement|Electronic engineering|Electronic equipment and components|Fatigue tests|Inspection|Integrated circuits|Limits (mathematics)|Marking|Measurement|Measuring techniques|Qualification tests|Ratings|Rectifier diodes|Reliability|Routine check tests|Semiconductor devices|Semiconductors|Specification (approval)|Symbols |
| ICS: | 31.080.10 - Diodos |
| CTN: | |
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Equivalencia Internacional |
Idéntica IEC 60747-2:2000 |
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Reemplazo Normas |
Reemplaza a DIN IEC 47E/81/CDV:1997-06 Reemplaza a DIN IEC 60747-2:1989-08 |
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