DIN ISO 11505:2018-02
Surface chemical analysis - General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry (ISO 11505:2012)
| Fecha edición: |
2018-02-01
En Vigor
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| Idiomas disponibles: | Inglés, Alemán |
| Resumen: | This document describes glow discharge optical emission spectroscopy (GD-OES) methods for the determination of the thickness, mass per unit area and chemical composition of surface layer films. |
| Keywords: | Depth profile|Emission spectral analysis|Emission spectrophotometry|Glow discharges|Materials|Materials testing|OES|Optical Emission Spectroscopy|Spectral analysis|Spectrochemical analysis|Spectrophotometry|Spectroscopy|Surfaces|Testing |
| ICS: | 71.040.40 - Análisis químico |
| CTN: | |
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Equivalencia Internacional |
Idéntica ISO 11505:2012 |
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Reemplazo Normas |
Reemplaza a DIN ISO 11505:2017-09 |
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