DIN ISO 24173:2025-11
Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24173:2024)
| Fecha edición: |
2025-11-01
En Vigor
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|---|---|
| Idiomas disponibles: | Inglés, Alemán |
| Keywords: | Analysis|Back-scattering|Chemical analysis and testing|Chemical composition|Crystallography|Crystals|Definitions|Determination|Diffraction|Electron beams|Electron diffraction|Interpretations|Measurement|Measuring accuracy|Measuring instruments|Measuring techniques|Methods|Methods of analysis|Microanalysis|Microbeam analysis|Orientation|Sampling methods|Scanning electron microscopes|Test reports|Test specimens|Testing|X-ray diffraction|X-ray fluorescence|X-ray spectrometer |
| ICS: | 71.040.50 - Métodos de análisis físicoquímicos |
| CTN: | |
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Equivalencia Internacional |
Idéntica ISO 24173:2024 |
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Reemplazo Normas |
Reemplaza a DIN ISO 24173:2013-04 Reemplaza a DIN ISO 24173:2025-04 |
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