IEC 62047-29:2017
Semiconductor devices - Micro-electromechanical devices - Part 29: Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
| Edition date: |
2017-11-22
In Force
|
|---|---|
| Available languages: | English |
| ICS: | 31.080.99-Other semiconductor devices |
| CTN: | 1449 |
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