IEEE 2427-2025
IEEE Standard for Analog Defect Modeling and Coverage
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¡RESERVA TU PLAZA AQUÍ!| Fecha edición: |
2026-01-09
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| Idiomas disponibles: | Inglés |
| Keywords: | AMS test|analog/mixed-signal test|analog test coverage|defect coverage|defective parts per million|design for test|DFT|DPPM|IEEE 2427(TM) |
| Scope: | New IEEE Standard - Active. A defect coverage accounting method based on simulation models for defects observed within integrated circuits (ICs) is defined in this standard. The portion of a defect universe, comprising thousands or millions of reasonably likely defects, that is detected or “covered” by tests of analog and mixed-signal circuits depends on many factors, which this standard considers, such as detectability, process variations, defect characteristics, and redundancy. The contents of a defect coverage summary are specified and dozens of commonly used terms are clearly defined to aid communication about the quality of tested ICs. |
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